MKS Inc. has introduced the Ophir® SP301Q Colloidal Quantum Dot (CQD) Beam Profiler, designed to provide high-quality characterization of visible, near-infrared (NIR), and shortwave infrared (SWIR) laser sources. 

The system is intended to address the cost and availability limitations associated with traditional InGaAs-based beam profiling cameras, including export control constraints.

Product photo of the Ophir SP301Q CQD beam profiler designed for visible, near-infrared, and shortwave infrared laser beam characterization. On Photonics Industry Monthly.

The Ophir SP301Q Colloidal Quantum Dot (CQD) beam profiler for characterization of visible, NIR, and SWIR laser sources. (Photo courtesy of MKS / Ophir)

The Ophir SP301Q beam profiler incorporates a CQD sensor architecture that delivers performance comparable to InGaAs sensors while offering a lower-cost alternative. According to the company, the profiler provides high sensitivity, a wide dynamic range, and fast shutter speeds to support detailed analysis of laser beam shape, size, and power. Target applications include precision material processing, LiDAR systems for autonomous vehicles, remote sensing, optical communications, and defense-related uses.

The SP301Q CQD beam profiler is capable of characterizing laser profiles across a wavelength range from 400 nm to 1700 nm. It is particularly suited for SWIR laser sources, including those operating at 1550 nm, which are commonly used for eye-safe applications and benefit from favorable atmospheric transmission. The profiler features a 9.6 mm × 7.7 mm active sensor area with 640 × 512-pixel resolution.

“Based on nanoscale semiconductor crystals, Colloidal Quantum Dot technology is compact, efficient, and cost-effective” said Reuven Silverman, General Manager, Ophir Photonics Products. “The Ophir SP301Q CQD beam profiler can achieve InGaAs-comparable performance at lower cost. It also avoids the limitations of traditional SWIR beam characterization methods that are inaccurate or expensive, often restricted by dual-use export regulations.”

The system is supplied with Ophir BeamGage® Professional software, which is used for laser beam analysis and measurement. The software incorporates Ultracal™, MKS’ proprietary baseline correction algorithm that contributed to the establishment of the ISO 11146-3 standard for beam measurement accuracy. BeamGage software supports ISO-compliant beam measurements, including power density, spot position, and spot diameter, as well as features such as image processing, trend analysis, data logging, pass/fail testing, and multilingual operation.

Designed for industrial and laboratory environments, the Ophir SP301Q CQD beam profiler includes a GigE interface to enable high-speed data transfer and integration into automated and networked measurement systems. The Ophir SP301Q CQD Beam Profiler is available now for immediate customer order.

About MKS Inc.

MKS Inc. (NASDAQ: MKSI) provides technologies that support advanced manufacturing, electronics, packaging, and specialty industrial applications. The company develops instruments, subsystems, systems, process control solutions, and specialty chemicals technologies used in semiconductor manufacturing and other high-precision industrial processes. MKS solutions support increased device complexity, performance optimization, and connectivity across a wide range of global technology markets. To learn more, please click here.

About the Ophir Brand of MKS

Ophir is a brand within the MKS Photonics Solutions Division, offering laser and LED measurement products including power and energy meters, laser beam profilers, optical components, and infrared imaging optics. Ophir solutions are used across semiconductor manufacturing, electronics and packaging, and specialty industrial applications, supporting measurement and characterization requirements from research through production environments.  For more information, please click here.

Source/Photo Credit: MKS Inc.


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Molly Bakewell Chamberlin
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